Navigation Institute of Nanotechnology and Materials Engineering About the Institute Science & Research Scientific Equipment Publications Seminars Scientific Divisions Teaching Cooperation with the industry Scientific Equipment Seebeck Coefficient / Electric Resistance Measuring System for direct ZT measurement. Automatic Specific Surface Area Analyzer with Vacuum System Scanning UV-Vis spectrophotometer ThermoFisher Scientific, Evolution 220 PerkinElmer Frontier FT MiD-IR and Far-IR System Ultra-high vacuum system equipped with AFM/STM microscope, XPS spectroscope and magnetron sputtering unit. Confocal Laser Microscope Olympus LEXT OLS 4000 The equipment for the electrical properties measurements. Dilatometer NETZSCH DIL 402 PC Nanoindenter TTX NHT2 CSM Thermo-microbalance, NETZSCH TG 209 F3 Tarsus® Thermal analyzer NETZSCH STA 449 F1 Jupiter® with quadrupole mass spectrometer 403 C Aëolos® NETZSCH Room Temperature Scanning Hall Probe Microscope (RT-SHPM) Arc-melter Edmund Bühler GmbH MAM-1 Physical Properties Measurement System (PPMS) Quantum Design AFM/STM Microscope NTEGRA Aura NT-MDT SEM Microscope FEI Quanta FEG 250 X-ray diffractometer X’Pert PRO (MPD) PANalytical Impedance spectrometer Novocontrol Alpha-A ALD – Atomic Layer Deposition System Beneq TFS 200 Thin Film Deposition System (PVD) Nano 36, Kurt J.Lesker
